Soamiangola Gianna Ramasombazaha, Elisée Rastefano. Enhancing FD-SOI MOSFET Performance and Reliability: A Comparative Study of High-k TiO₂ versus Standard SiO₂ Buried Oxides. RIRS [Internet]. 2026Feb.1 [cited 2026Feb.11];4(1):707-24. Available from: https://www.revue-irs.com/index.php/home/article/view/1477