Soamiangola Gianna Ramasombazaha, and Elisée Rastefano. “Enhancing FD-SOI MOSFET Performance and Reliability: A Comparative Study of High-K TiO₂ Versus Standard SiO₂ Buried Oxides”. Revue Internationale de la Recherche Scientifique (Revue-IRS) 4, no. 1 (February 1, 2026): 707–724. Accessed February 11, 2026. https://www.revue-irs.com/index.php/home/article/view/1477.