Soamiangola Gianna Ramasombazaha, & Elisée Rastefano. (2026). Enhancing FD-SOI MOSFET Performance and Reliability: A Comparative Study of High-k TiO₂ versus Standard SiO₂ Buried Oxides. Revue Internationale De La Recherche Scientifique (Revue-IRS), 4(1), 707–724. https://doi.org/10.5281/zenodo.18450813